This article is from the Apple II Csa2 FAQ, by Jeff Hurlburt with numerous contributions by others.
IIgs Diagnostic Self-Test Error Codes
By: a list by Jeff Tarr, Jr., Apple IIgs Technical Reference
by M. Fischer, and IIgs TechNote #095 by Dan Strnad
The IIgs self-test is activated by pressing Open-Apple and Option on power
up, or Open-Apple, Option, and Reset. During the test, the test number (in
hexadecimal) is visible on the bottom of the screen followed by six zeros.
After all tests are complete, a continuous 6 KHz one-second beep sounds and the
screen displays a System Good message.
If a test fails, the screen immediately displays a message "System Bad:
" followed by an eight-digit code (in hexadecimal) on the lower left hand side.
The code is also displayed staggered in the upper left hand area to help you
read it in the event of a display RAM failure. In case there is a video
failure, the code is also sent to the printer port.
Example 1: You get the message "System Bad: 05020000"
This indicates failure of Test #05, the Fast Processor Interface Speed Test.
The "02" says that the FPI got stuck in Fast mode (i.e. it could not switch to
"Normal" Slow speed when asked to). Test #05 does not use the last four digits.
Example 2: You get the message "System Bad: 080200D4"
This indicates failure of Test #08, the Battery RAM Test. The "02" says that
there was a problem reading and writing a test value to some address. Next, the
"00" says that the test value was $00. "D4" says that the problem occurred with
address $D4 in the Bat RAM.
Diagnostic Self-Test Error Codes
Error Codes are eight hexadecimal digits in the format 'AABBCCDD'. The first
two digits (the "AA" part) always show the test number. The meaning of the
remaining six digits depends upon the particular test. (There may be a few
differences in the GS diagnostic self-test depending upon ROM version. For
example, earlier GS's may not include Test #0C (AA= 0C).)
ROM Test:G
AA= 01 BB= Failed checksum DD= 01: RAM error
Note: A ROM failure will also be denoted by "RM" in the top left
hand corner of the screen.
RAM 1 Test:H
AA= 02 BB= __: Bank number CC= Bit(s) failed
FF: ADB Tool error
Soft Switches:M
AA= 03 BB= State Register bit CC= Read addr. Low Byte
Address Test:K
AA= 04 BB= __: Bank number CCDD= Failed RAM Address
FF: ADB Tool error
Speed Test (FPI):
AA= 05 BB= 01: Stuck slow
02: Stuck fast
Note: If a ZipGS accelerator card is installed and not disabled
and DIP Switch 1-4 (Counter Delay) is not set OFF (the normal,
default setting), your GS will bomb on Test 05. John Link reports
that a TransWarp GS with the v1.5 ROM will fail the Speed Test.
In neither case does failure indicate any actual malfunction.
Serial Test:1
AA= 06 BB= 01: Register R/W
04: Tx Buffer empty status
05: Tx Buffer empty failure
06: All Sent Status fail
07: Rx Char available
08: Bad data
Clock Test:H
AA= 07 DD= 01: Fatal error occurred - test aborted
Bat RAM Test:F
AA= 08 BB= 01: Addr. unique CC= bad addr
02: NV RAM pattern CC= bad patt DD= bad addr
ADB Test:J
AA= 09 BBCC= Bad checksum DD= 01: Fatal error
Shadow Register:
AA= 0A BB= 01: Text page 1 fail
02: Text page 2 fail
03: ADB Tool call error
04: Power on Clear bit error
Interrupts Test (Mega II and Video Graphics Controller):
AA= 0B BB= 01: VBL interrupt time-out
02: VBL IRQ status full
03: 1/4 sec interrupt
04: 1/4 sec interrupt
06: VGC IRQ
07: Scan line
Note: There are reports that if a ZipGS accelerator card is installed
and not disabled, then, your GS may fail parts of this test depending
upon DIP Switch settings. Such a failure does not necessarily indicate
a hardware fault.
Sound Test:3
AA= 0C DD= 01: RAM data error
02: RAM address error
03: Data register failed
04: Control register failed
05: Oscillator interrupt timeout
Note: There are reports that if a ZipGS accelerator card is installed
and not disabled, then, your GS may fail parts of this test depending
upon DIP Switch settings. Such a failure does not necessarily indicate
a hardware fault.
Other
AA= FF (test number= $FF) According to M. Fischer this shows a likely
problem with the Mega II chip because that test number is used only
during manufacturing testing.
By: Paul Creager
 
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